Show simple item record

dc.contributor.authorKhakifirooz, Marzieh
dc.contributor.authorTseng, Sheng-Tsaing
dc.contributor.authorFathi, Mahdi
dc.date.accessioned2019-08-08T20:52:55Z
dc.date.available2019-08-08T20:52:55Z
dc.date.issued2019-07-29
dc.identifier.urihttps://hdl.handle.net/11668/14654
dc.descriptionhttps://www.tandfonline.com/doi/abs/10.1080/00401706.2019.1647880en_US
dc.description.abstractThe performance of reliability inference strongly depends on the modeling of the product’s lifetime distribution. Many products have complex lifetime distributions whose optimal settings are not easily found. Practitioners prefer to utilize simpler lifetime distribution to facilitate the data modeling process while knowing the true distribution. Therefore, the effects of model mis-specification on the product’s lifetime prediction is an interesting research area. This paper presents some results on the behavior of the relative bias (RB) and relative variability (RV) of p-th quantile of the accelerated lifetime (ALT) experiment when the generalized Gamma (GG3) distribution is incorrectly specified as Lognormal or Weibull distribution. Both complete and censored ALT models are analyzed. At first, the analytical expressions for the expected log-likelihood function of the mis-specified model with respect to the true model is derived. Consequently, the best parameter for the incorrect model is obtained directly via a numerical optimization to achieve a higher accuracy model than the wrong one for the end-goal task. The results demonstrate that the tail quantiles are significantly overestimated (underestimated) when data is wrongly fitted by Lognormal (Weibull) distribution. Moreover, the variability of the tail quantiles is significantly enlarged when the model is incorrectly specified as Lognormal or Weibull distribution. Precisely, the effect on the tail quantiles is more significant when the sample size and censoring ratio are not large enough. Supplementary materials for this article are available online.en_US
dc.description.sponsorshiphttps://www.tandfonline.com/doi/abs/10.1080/00401706.2019.1647880en_US
dc.language.isoen_USen_US
dc.publisherMississippi State Universityen_US
dc.subjectArrhenius Modelen_US
dc.subjectAsymptotic Biasen_US
dc.subjectAsymptotic Variationen_US
dc.subjectGeneralized Gamma Distributionen_US
dc.subjectLognormal Distributionen_US
dc.subjectModel Mis-Specificationen_US
dc.subjectWeibull Distributionen_US
dc.titleModel Mis-Specification of Generalized Gamma Distribution for Accelerated Lifetime Censored Dataen_US
dc.typeArticleen_US
dc.publisher.departmentDepartment of Industrial and Systems Engineeringen_US
dc.publisher.collegeJames Worth Bagley College of Engineeringen_US
dc.identifier.doi10.1080/00401706.2019.1647880


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record