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dc.contributor.advisorDunne, James A.en_US
dc.contributor.authorGaerlan, Oliver Mikhail H.en_US
dc.description.abstractThe experiment will measure the thickness of a thin aluminum foil by sending a beam of x-rays through the foil. The thickness of the foil is related to the difference in the intensity of x-rays that pass through the aluminum window and the initial intensity of the x-ray source. The intensity is also related to a property of the material known as its attenuation coefficient. To calculate the attenuation coefficient, another foil with known thickness, mass, and surface density is used to calculate the attenuation coefficient.en_US
dc.publisherMississippi State Universityen_US
dc.publisherJudy and Bobby Shackouls Honors Collegeen_US
dc.relation.ispartofseriesJudy and Bobby Shackouls Honors College Undergraduate Senior Thesesen_US
dc.subject.lcshUniversities and colleges--Honors coursesen_US
dc.subject.othermaterial thicknessen_US
dc.subject.otherx-ray attenuationen_US
dc.subject.otherQweak experimenten_US
dc.subject.otherattenuation coefficienten_US
dc.titleMeasurement of material thickness using X-ray attenuationen_US
dc.typeHonors Thesisen_US
dc.publisher.departmentDepartment of Physics and Astronomyen_US
dc.publisher.collegeJudy and Bobby Shackouls Honors Collegeen_US
dc.publisher.collegeCollege of Arts and Sciencesen_US
dc.publisher.officeHonors Office of Undergraduate Researchen_US
dc.contributor.issuingbodyMississippi State Universityen_US
dc.source.institutionMississippi State Universityen_US
dc.subject.degreeBachelor of Scienceen_US
dc.contributor.committeeDutta, Dipangkaren_US
dc.contributor.committeeOppenheimer, Seth F.en_US

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  • Honors Theses
    Theses written by students of the Judy and Bobby Shackouls Honors College.

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