Measurement of material thickness using X-ray attenuation
Gaerlan, Oliver Mikhail H.
Item TypeHonors Thesis
AdvisorDunne, James A.
Oppenheimer, Seth F.
The experiment will measure the thickness of a thin aluminum foil by sending a beam of x-rays through the foil. The thickness of the foil is related to the difference in the intensity of x-rays that pass through the aluminum window and the initial intensity of the x-ray source. The intensity is also related to a property of the material known as its attenuation coefficient. To calculate the attenuation coefficient, another foil with known thickness, mass, and surface density is used to calculate the attenuation coefficient.
DegreeBachelor of Science
CollegeJudy and Bobby Shackouls Honors College
College of Arts and Sciences