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dc.contributor.authorPaliwal, S.
dc.contributor.authorBaskin, C. C.
dc.contributor.authorDelouche, James C.
dc.date.accessioned2016-07-21T21:22:54Z
dc.date.available2016-07-21T21:22:54Z
dc.date.issued1991
dc.identifier.urihttp://hdl.handle.net/11668/13349
dc.languageen_US
dc.publisherMississippi Agricultural and Forestry Experiment Station
dc.relation.ispartofseriesSeed Technology Papers; G-38
dc.subject.otherSorghum
dc.subject.otherDensity
dc.subject.otherScanning
dc.subject.otherElectron
dc.subject.otherMicroscopy
dc.titleScanning Electron Microscopy of High Quality and Low Quality Sorghum Seeds
dc.publisher.researchcenterMississippi Agricultural and Forestry Experiment Station
dc.contributor.issuingbodyMississippi State Universityen_US


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